QS metrology

Table top Surface
Roughness Tester

Table top Surface Roughness
Tester

SURFCOM TOUCH 50 system come with an intuitive and easy-to-use screen for condition setting, calibration, measurement and analysis. An amplifier with a 7-inch wide touch panel and a new interface provides higher operability. Easy-to-use operation eliminates the need of instructions. The high performance pickup with an extended measurement range from 800 to 1,000 μm and a Z-axis minimum resolution of 0.0001 μm allows for wide-range and high resolution skid less measurement. In addition to a flat surface, the roughness or waviness on an undulating surface such as a stepped or round surface can be evaluated with one trace.

SURFCOM TOUCH 50 has skid less measurement with a high-performance pickup while having high resolution and with a wide measuring range. Various types of workpieces can be measured by changing the stylus for deep, long, or small holes or a round surface.

Technical Specification
Z direction±500 μm
X direction50 mm
Evaluation Length0.1 to 50 mm
Straightness accuracy0.3 μm/50 mm
Detector vertical movement volume50 mm
Measurement Speed0.15, 0.3, 0.6, 1.5, 3 / 0.05, 0.1, 0.2, 0.5, 1 mm/s (Switching)
Pickup Sensing typeDifferential inductance
Measurement MethodSkid less/Skid (optional)
Z direction resolution0.0001 μm/±40 μm, 0.00125 μm/±500 μm
Measurement force0.75 mN
Stylus Radiusrtip = 2 μm
Stylus Angle60°cone
Stylus MaterialDiamond
Calculation StandardsComply with JIS2013/2001, JIS1994, JIS1982, ISO1997/2009, ISO13565, DIN1990, ASME2002/2009, ASME1995, CNOMO
Parameter – Profile CurvePa, Pq, Pp, Pv, Pc, PSm, PΔq, PPc, Psk, Pku, Pt, Pmr(c), Pmr, Pδc, Rz82, TILTA, AVH, Hmax, Hmin, AREA, Rmax, Rz, Sm, Δa, Δq, λa, λq, Lr, Rsk, Rku, Rk, Rpk, Rvk, Mr1, Mr2, Vo, K, tp, tp2, Hp
Parameter – Roughness CurveRa, Rq, Rz, Rv, Rc, Rt, RSm, RΔq, Rsk, Rku, Rmr(c), Rmr, Rδc, Rz94, R3z, RΔa, Rλa, Rλq, Ry, Lr, Sm, S, tp, tp2, PC, RPc JIS, RPc ISO, RPc EN, Pc, PPI, Rp, Rmax, Rz.I, RS, Rmr2, Mr1, Mr2, Rpk, Rvk, Rk, Vo, K, A1, A2, Rpm, Δa, Δq, Htp
Parameter – Waviness Profile CurveWa, Wq, Wt, Wp, Wv, WSm, WPc, Wsk, Wmr(c), Wmr, Wδc, Wz, Wc, Wku, WΔq, WEM, WEA, WE-a, WE-q, WE-p, WE-v, WE-Sm, WEC-q, WEC-m, WEC-p, WEC-v, WEC-Sm
Parameter – MotifR, Rx, AR, W, Wx, AW, Rke, Rpke, Rvke, NCRX, NR, CPM, SR, SAR, Wte, NW, SAW, SW, Mr1e, Mr2e, Vo, K
Evaluation CurveProfile Curve, Roughness Curve, Filtered Waviness Curve, Waviness Profile Curve, ISO13565 Special Roughness Curve, Roughness motif curve, Waviness motif curve, Upper envelope waviness curve, Rolling Circle Waviness Curve
Characteristics graphAbbot curve, Amplitude density function, Power graph
Filter typeGaussian, 2RC (phase compensation), 2RC (non-phase compensation)
Cutoff value – λc0.08, 0.25, 0.8, 2.5, 8, 25 mm
Cutoff value – λsNone, 2.5, 8, 25 μm
Display7-inch color liquid crystal touch panel
Data outputUSB connectors for USB memory, Micro USB connector for USB communication
Print outputInbuilt Thermal printer
LanguageJapanese, English, Chinese (Traditional Chinese/Simplified Chinese), Korean, Thai, Malay, Vietnamese, Indonesian, German, French, Italian, Czech, Polish, Hungarian, Turkish, Swedish, Dutch, Spanish, Portuguese
Power SupplyAC100 to 240 V ±10%, 50/60 Hz, Single phase
Power Supply – ChargingBuilt-in battery (to be charged using AC adaptor), charging period: 3 hours (about 600 measurements can be take when fully charged)
Power consumptionMaximum 80 VA
External dimensionsAmplification indicator : 320 x 167 x 44 mm/about 4.2 kg for the entire system
Standard accessoriesRoughness specimen (E-MC-S24C), touch pen (E-MA-S112A), printing paper (E-CH-S25A)*1, instruction manuals, SupportWare II